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» A scalable method for the generation of small test sets
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TAP
2010
Springer
102views Hardware» more  TAP 2010»
14 years 24 days ago
Generating High-Quality Tests for Boolean Circuits by Treating Tests as Proof Encoding
Abstract. We consider the problem of test generation for Boolean combinational circuits. We use a novel approach based on the idea of treating tests as a proof encoding rather than...
Eugene Goldberg, Panagiotis Manolios
ACSW
2004
13 years 9 months ago
A wavelet-based neuro-fuzzy system for data mining small image sets
Creating a robust image classification system depends on having enough data with which one can adequately train and validate the model. If there is not enough available data, this...
Brendon J. Woodford, Da Deng, George L. Benwell
ISSRE
2007
IEEE
13 years 9 months ago
Generating Trace-Sets for Model-based Testing
Model-checkers are powerful tools that can find individual traces through models to satisfy desired properties. These traces provide solutions to a number of problems. Instead of...
Birgitta Lindström, Paul Pettersson, Jeff Off...
CORR
2011
Springer
189views Education» more  CORR 2011»
13 years 2 months ago
A Factorial Experiment on Scalability of Search Based Software Testing
Software testing is an expensive process, which is vital in the industry. Construction of the test-data in software testing requires the major cost and to decide which method to us...
Arash Mehrmand, Robert Feldt
DAC
2006
ACM
14 years 8 months ago
Timing-based delay test for screening small delay defects
The delay fault test pattern set generated by timing unaware commercial ATPG tools mostly affects very short paths, thereby increasing the escape chance of smaller delay defects. ...
Nisar Ahmed, Mohammad Tehranipoor, Vinay Jayaram