1175 search results - page 69 / 235 » A scalable method for the generation of small test sets |
SIGSOFT
2007
ACM
14 years 8 months ago
2007
ACM
The systematic exploration of the space of all the behaviours of a software system forms the basis of numerous approaches to verification. However, existing approaches face many c...
FPL
2008
Springer
13 years 9 months ago
2008
Springer
In many applications, subsequent data manipulations differ only in a small set of parameter values. Because of their reconfigurability, FPGAs (Field Programmable Gate Arrays) can ...
ICWE
2010
Springer
13 years 5 months ago
2010
Springer
Large amounts of information are posted daily on the Web, such as articles published online by traditional news agencies or blog posts referring to and commenting on various events...
CEC
2010
IEEE
13 years 9 months ago
2010
IEEE
Inspired originally by the Learnable Evolution Model(LEM) [5], we investigate LEM(ID3), a hybrid of evolutionary search with ID3 decision tree learning. LEM(ID3) involves interleav...
ASPDAC
2004
ACM
14 years 1 months ago
2004
ACM
- Under manufacturing process variation, a path through a fault site is called longest for delay test if there exists a process condition under which the path has the maximum delay...