1175 search results - page 6 / 235 » A scalable method for the generation of small test sets |
COMPSAC
2006
IEEE
14 years 1 months ago
2006
IEEE
Combinatorial covering arrays have been used in several testing approaches. This paper first discusses some existing methods for finding such arrays. Then a SAT-based approach a...
BMCBI
2005
13 years 7 months ago
2005
Background: The evaluation of statistical significance has become a critical process in identifying differentially expressed genes in microarray studies. Classical p-value adjustm...
ICSE
2007
IEEE-ACM
14 years 7 months ago
2007
IEEE-ACM
We present a technique that improves random test generation by incorporating feedback obtained from executing test inputs as they are created. Our technique builds inputs incremen...
MTV
2005
IEEE
14 years 1 months ago
2005
IEEE
Microprocessor technology is increasingly used for many applications; the large market volumes call for cost containment in the production phase. Process yield for processor produ...
DATE
2008
IEEE
2008
IEEE
State Skip LFSRs: Bridging the Gap between Test Data Compression and Test Set Embedding for IP Cores
13 years 9 months ago
1 We present a new type of Linear Feedback Shift Registers, State Skip LFSRs. State Skip LFSRs are normal LFSRs with the addition of a small linear circuit, the State Skip circuit,...