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» A secure scan design methodology
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IS
2007
13 years 7 months ago
Security Attack Testing (SAT) - testing the security of information systems at design time
For the last few years a considerable number of efforts have been devoted into integrating security issues into information systems development practices. This has led to a number...
Haralambos Mouratidis, Paolo Giorgini
GI
2004
Springer
14 years 1 months ago
Towards a Framework and a Design Methodology for Autonomic Integrated Systems
: The transition from microelectronics to nanoelectronics reaches physical limits and results in a paradigm shift in the design and fabrication of electronic circuits. The conserva...
Andreas Herkersdorf, Wolfgang Rosenstiel
IOLTS
2006
IEEE
101views Hardware» more  IOLTS 2006»
14 years 1 months ago
Delay Fault Localization in Test-Per-Scan BIST Using Built-In Delay Sensor
— Delay failures are becoming a dominant failure mechanism in nanometer technologies. Diagnosis of such failures is important to ensure yield and robustness of the design. Howeve...
Swaroop Ghosh, Swarup Bhunia, Arijit Raychowdhury,...
DBSEC
2006
125views Database» more  DBSEC 2006»
13 years 9 months ago
Aspect-Oriented Risk Driven Development of Secure Applications
Abstract. Security breaches seldom occur because of faulty security mechanisms. Often times, security mechanisms are incorrectly incorporated in an application which allows them to...
Geri Georg, Siv Hilde Houmb, Indrakshi Ray
FCCM
2004
IEEE
133views VLSI» more  FCCM 2004»
13 years 11 months ago
A Methodology for Synthesis of Efficient Intrusion Detection Systems on FPGAs
Intrusion detection for network security is a computation intensive application demanding high system performance. System level design, a relatively unexplored field in this area,...
Zachary K. Baker, Viktor K. Prasanna