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IOLTS   2006 IEEE International On-Line Testing Symposium
Wall of Fame | Most Viewed IOLTS-2006 Paper
IOLTS
2006
IEEE
103views Hardware» more  IOLTS 2006»
14 years 6 months ago
Designing Robust Checkers in the Presence of Massive Timing Errors
So far, performance and reliability of circuits have been determined by worst-case characterization of silicon and environmental noise. As new deep sub-micron technologies exacerb...
Frederic Worm, Patrick Thiran, Paolo Ienne
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