2796 search results - page 76 / 560 » A time structure based software reliability model |
IOLTS
2002
IEEE
14 years 2 months ago
2002
IEEE
A silicon independent C-Based model of the TTP/C protocol was implemented within the EU-founded project FIT. The C-based model is integrated in the C-Sim simulation environment. T...
ICST
2010
IEEE
13 years 7 months ago
2010
IEEE
—Markov chains with Labelled Transitions can be used to generate test cases in a model-based approach. These test cases are generated by random walks on the model according to pr...
SIGSOFT
2004
ACM
14 years 9 months ago
2004
ACM
Defect-occurrence projection is necessary for the development of methods to mitigate the risks of software defect occurrences. In this paper, we examine user-reported software def...
FDL
2004
IEEE
14 years 24 days ago
2004
IEEE
gn process of embedded systems moves currently towards higher levels of abstraction. As a consequence, a need arises for an early and realistic assessment of system level design d...
DATE
2010
IEEE
14 years 2 months ago
2010
IEEE
—Variations of process parameters have an important impact on reliability and yield in deep sub micron IC technologies. One methodology to estimate the influence of these effects...