A silicon independent C-Based model of the TTP/C protocol was implemented within the EU-founded project FIT. The C-based model is integrated in the C-Sim simulation environment. T...
Astrit Ademaj, Petr Grillinger, Pavel Herout, Jan ...
—Markov chains with Labelled Transitions can be used to generate test cases in a model-based approach. These test cases are generated by random walks on the model according to pr...
Defect-occurrence projection is necessary for the development of methods to mitigate the risks of software defect occurrences. In this paper, we examine user-reported software def...
Paul Luo Li, Mary Shaw, James D. Herbsleb, Bonnie ...
gn process of embedded systems moves currently towards higher levels of abstraction. As a consequence, a need arises for an early and realistic assessment of system level design d...
—Variations of process parameters have an important impact on reliability and yield in deep sub micron IC technologies. One methodology to estimate the influence of these effects...