130 search results - page 22 / 26 » Accurate and scalable reliability analysis of logic circuits |
ICPR
2010
IEEE
13 years 9 months ago
2010
IEEE
Reliable and generic methods for skew detection are a necessity for any large-scale digitization projects. As one of the first processing steps, skew detection and correction has...
ISQED
2008
IEEE
14 years 1 months ago
2008
IEEE
Negative bias temperature instability (NBTI) is one of the primary limiters of reliability lifetime in nano-scale integrated circuits. NBTI manifests itself in a gradual increase ...
IJACTAICIT
2010
13 years 4 months ago
2010
In this paper, we propose SiLo, a novel energy efficient shifted logging storage architecture, for write-oriented workloads. By organizing free storage space of redundant mirrored...
DOA
2001
13 years 8 months ago
2001
There are many challenges in devising solutions for online content processing of live networked multimedia sessions. These include content analysis under uncertainty (evidence of ...
DAC
2009
ACM
14 years 1 months ago
2009
ACM
Manufacturing process variability impacts the performance of synchronous logic circuits by means of its effect on both clock network and functional block delays. Typically, varia...