ISQED 2008 - PDF Preprint Papers

ISQED 2008 International Symposium on Quality Electronic Design

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ISQED
2008
IEEE

186views Hardware» more ISQED 2008»

Reliability-Aware Optimization for DVS-Enabled Real-Time Embedded Systems

14 years 5 months ago

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—Power and energy consumption has emerged as the premier and most constraining aspect in modern computational systems. Dynamic Voltage Scheduling (DVS) has been provably one of t...

Foad Dabiri, Navid Amini, Mahsan Rofouei, Majid Sa...

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Id	Views	Title	Status

1	186	Reliability-Aware Optimization for DVS-Enabled Real-Time Embedded Systems	claim
2	154	Error Protected Data Bus Inversion Using Standard DRAM Components	claim
3	153	ILP Based Gate Leakage Optimization Using DKCMOS Library during RTL Synthesis	claim
4	153	Accelerating Clock Mesh Simulation Using Matrix-Level Macromodels and Dynamic Time Step Rounding	claim
5	151	Quality of a Bit (QoB): A New Concept in Dependable SRAM	claim
6	150	Fundamental Data Retention Limits in SRAM Standby Experimental Results	claim
7	150	Dominant Substrate Noise Coupling Mechanism for Multiple Switching Gates	claim
8	142	Clock Skew Analysis via Vector Fitting in Frequency Domain	claim
9	124	Parasitic Aware Process Variation Tolerant Voltage Controlled Oscillator (VCO) Design	claim
10	120	Error-Tolerant SRAM Design for Ultra-Low Power Standby Operation	claim
11	119	Instruction Scheduling for Variation-Originated Variable Latencies	claim
12	118	A Thermal-Friendly Load-Balancing Technique for Multi-Core Processors	claim
13	117	A Basis for Formal Robustness Checking	claim
14	115	Elastic Timing Scheme for Energy-Efficient and Robust Performance	claim
15	112	Robust Analog Design for Automotive Applications by Design Centering with Safe Operating Areas	claim
16	109	Minimizing Offset for Latching Voltage-Mode Sense Amplifiers for Sub-Threshold Operation	claim
17	103	Process Variation Characterization and Modeling of Nanoparticle Interconnects for Foldable Electronics	claim
18	103	Modeling of NBTI-Induced PMOS Degradation under Arbitrary Dynamic Temperature Variation	claim
19	101	Projection-Based Piecewise-Linear Response Surface Modeling for Strongly Nonlinear VLSI Performance Variations	claim
20	98	Design Margin Exploration of Spin-Torque Transfer RAM (SPRAM)	claim
21	94	Processor Verification with hwBugHunt	claim
22	92	Clock Skew Evaluation Considering Manufacturing Variability in Mesh-Style Clock Distribution	claim
23	86	Improving the Efficiency of Power Management Techniques by Using Bayesian Classification	claim
24	85	A Statistic-Based Approach to Testability Analysis	claim
25	79	Statistic Analysis of Power/Ground Networks Using Single-Node SOR Method	claim
26	66	An Implementation of Performance-Driven Block and I/O Placement for Chip-Package Codesign	claim

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