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VTS
1996
IEEE
112views Hardware» more  VTS 1996»
15 years 8 months ago
Optimal voltage testing for physically-based faults
In this paper we investigate optimal voltage testing approaches for physically-based faults in CMOS circuits. We describe the general nature of the problem and then focus on two f...
Yuyun Liao, D. M. H. Walker
COLT
1992
Springer
15 years 8 months ago
Learning Switching Concepts
We consider learning in situations where the function used to classify examples may switch back and forth between a small number of different concepts during the course of learnin...
Avrim Blum, Prasad Chalasani
AUSDM
2006
Springer
100views Data Mining» more  AUSDM 2006»
15 years 8 months ago
Data Mining Methodological Weaknesses and Suggested Fixes
Predictive accuracy claims should give explicit descriptions of the steps followed, with access to the code used. This allows referees and readers to check for common traps, and t...
John H. Maindonald
DAC
2005
ACM
15 years 6 months ago
Path delay test compaction with process variation tolerance
In this paper we propose a test compaction method for path delay faults in a logic circuit. The method generates a compact set of two-pattern tests for faults on long paths select...
Seiji Kajihara, Masayasu Fukunaga, Xiaoqing Wen, T...
EACL
2010
ACL Anthology
15 years 5 months ago
Generating Approximate Geographic Descriptions
Georeferenced data sets are often large and complex. Natural Language Generation (NLG) systems are beginning to emerge that generate texts from such data. One of the challenges th...
Ross Turner, Somayajulu Sripada, Ehud Reiter