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ISBI
2008
IEEE
14 years 8 months ago
Deconvolution of 3D fluorescence micrographs with automatic risk minimization
We investigate the problem of automatic tuning of a deconvolution algorithm for three-dimensional (3D) fluorescence microscopy; specifically, the selection of the regularization p...
Sathish Ramani, Cédric Vonesch, Michael Uns...
LSO
2004
Springer
14 years 1 months ago
Learning How to Manage Risks Using Organizational Knowledge
In spite of being an important software activity, many software organizations present difficulties in managing risks. This happens mainly due to their low maturity level, and becau...
Ricardo de Almeida Falbo, Fabiano Borges Ruy, Glei...
DATE
2000
IEEE
65views Hardware» more  DATE 2000»
14 years 6 days ago
Test Quality and Fault Risk in Digital Filter Datapath BIST
An objective of DSP testing should be to ensure that any errors due to missed faults are infrequent compared to a circuit’s intrinsic errors, such as overflow. A method is prop...
Laurence Goodby, Alex Orailoglu
ALT
2010
Springer
13 years 9 months ago
Bayesian Active Learning Using Arbitrary Binary Valued Queries
We explore a general Bayesian active learning setting, in which the learner can ask arbitrary yes/no questions. We derive upper and lower bounds on the expected number of queries r...
Liu Yang, Steve Hanneke, Jaime G. Carbonell
COLT
2005
Springer
14 years 1 months ago
Ranking and Scoring Using Empirical Risk Minimization
A general model is proposed for studying ranking problems. We investigate learning methods based on empirical minimization of the natural estimates of the ranking risk. The empiric...
Stéphan Clémençon, Gáb...