— As nanometer technology advances, the post-CMP dielectric thickness variation control becomes crucial for manufacturing closure. To improve CMP quality, dummy feature filling ...
Abstract. In this paper we investigate the design space of access control logics. Specifically, we consider several possible axioms for the common operator says. Some of the axioms...
In this paper, a new framework for the tracking of closed curves is described. The proposed approach, formalized through an optimal control technique, enables a continuous trackin...
Abstract. The paper focuses on the efficiency of the hybrid evolutionary algorithm (HEA) for solving the global optimization problem arising in electronic imaging. The particular v...