26 search results - page 4 / 6 » Adaptive Diagnostic Pattern Generation for Scan Chains |
DAC
2007
ACM
14 years 9 months ago
2007
ACM
Many STUMPS architectures found in current chip designs allow disabling of individual scan chains for debug and diagnosis. In a recent paper it has been shown that this feature can...
DFT
2008
IEEE
14 years 3 months ago
2008
IEEE
Integrated circuits (IC) targeting at the streaming applications for tomorrow are becoming a fast growing market. Applications such as beamforming require mass computing capabilit...
ISBI
2006
IEEE
14 years 2 months ago
2006
IEEE
This contribution describes a novel non-contact fluorescence optical tomography scheme which utilizes multiple area illumination patterns, to reduce the illposedness of the inver...
ATS
2005
IEEE
14 years 2 months ago
2005
IEEE
Abstract—This paper presents a low transition test pattern generator, called LT-LFSR, to reduce average and peak power of a circuit during test by reducing the transitions within...
ARCS
2005
Springer
14 years 2 months ago
2005
Springer
We propose an active vision system for object acquisition. The core of our approach is a reinforcement learning module which learns a strategy to scan an object. The agent moves a...