Many STUMPS architectures found in current chip designs allow disabling of individual scan chains for debug and diagnosis. In a recent paper it has been shown that this feature can...
Christian G. Zoellin, Hans-Joachim Wunderlich, Jen...
Integrated circuits (IC) targeting at the streaming applications for tomorrow are becoming a fast growing market. Applications such as beamforming require mass computing capabilit...
This contribution describes a novel non-contact fluorescence optical tomography scheme which utilizes multiple area illumination patterns, to reduce the illposedness of the inver...
Amit Joshi, Wolfgang Bangerth, Eva M. Sevick-Murac...
Abstract—This paper presents a low transition test pattern generator, called LT-LFSR, to reduce average and peak power of a circuit during test by reducing the transitions within...
Mohammad Tehranipoor, Mehrdad Nourani, Nisar Ahmed
We propose an active vision system for object acquisition. The core of our approach is a reinforcement learning module which learns a strategy to scan an object. The agent moves a...
Gabriele Peters, Claus-Peter Alberts, Markus Bries...