21183 search results - page 132 / 4237 » Adaptive Testing by Test |
118
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CONCUR
1999
Springer
15 years 8 months ago
1999
Springer
This paper discusses the use of formal methods in testing of concurrent systems. It is argued that formal methods and testing can be mutually profitable and useful. A framework fo...
108
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ITC
1989
IEEE
15 years 8 months ago
1989
IEEE
: The concept of a pseudo-exhaustive test for sequential circuits is introduced in a similar way as it is used for combinational networks. Instead of test sets one has to apply pse...
134
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AICCSA
2001
IEEE
15 years 8 months ago
2001
IEEE
In corrective maintenance, selective regression testing includes test selection from previously run test suite and test coverage identification. We propose three reductionbased re...
168
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ITC
1995
IEEE
15 years 8 months ago
1995
IEEE
This paper describes the testing of a chip especially designed to facilitate the evaluation of various test techniques for combinational circuitry. The different test sets and tes...
141
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DELTA
2008
IEEE
15 years 6 months ago
2008
IEEE
This paper presents a technique that limits the maximum number of specified bits of any pattern in a given test set. The outlined method uses algorithms similar to ATPG, but explo...