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ICCAD
1994
IEEE
110views Hardware» more  ICCAD 1994»
15 years 8 months ago
Test pattern generation based on arithmetic operations
Existing built-in self test (BIST) strategies require the use of specialized test pattern generation hardware which introduces signi cant area overhead and performance degradation...
Sanjay Gupta, Janusz Rajski, Jerzy Tyszer
COMPSAC
2004
IEEE
15 years 8 months ago
Cooperative and Group Testing in Verification of Dynamic Composite Web Services
Verifying Web Services (WS) in a dynamic Service Oriented Architecture (SOA) is challenging because new services can be composed at runtime using existing WS. Furthermore, in a co...
Wei-Tek Tsai, Yinong Chen, Raymond A. Paul, Ning L...
ERSHOV
2006
Springer
15 years 8 months ago
TTCN-3 for Distributed Testing Embedded Software
Abstract. TTCN-3 is a standardized language for specifying and executing test suites that is particularly popular for testing embedded systems. Prior to testing embedded software i...
Stefan Blom, Thomas Deiß, Natalia Ioustinova...
FMCO
2006
Springer
128views Formal Methods» more  FMCO 2006»
15 years 8 months ago
Model-Based Test Selection for Infinite-State Reactive Systems
This paper addresses the problem of off-line selection of test cases for testing the conformance of a black-box implementation with respect to a specification, in the context of re...
Bertrand Jeannet, Thierry Jéron, Vlad Rusu
153
Voted
COMPSAC
2009
IEEE
15 years 8 months ago
Practical Extensions of a Randomized Testing Tool
—Many efficient random testing algorithms for object-oriented software have been proposed due to their simplicity and reasonable code coverage; however, even the stateof-the-art...
Hojun Jaygarl, Carl K. Chang, Sunghun Kim