Sciweavers

21183 search results - page 18 / 4237
» Adaptive Testing by Test
Sort
View
111
Voted
ITC
2003
IEEE
176views Hardware» more  ITC 2003»
15 years 9 months ago
Instruction Based BIST for Board/System Level Test of External Memories and Internconnects
ct This paper describes a general technique to test external memory/caches and memory interconnects using on-chip logic. Such a test methodology is expected to significantly reduc...
Olivier Caty, Ismet Bayraktaroglu, Amitava Majumda...
181
Voted
HASE
2002
IEEE
15 years 8 months ago
An Approach to Specify and Test Component-Based Dependable Software
Components (in-house or pre-fabricated) are increasingly being used to reduce the cost of software development. Given that these components may not have not been developed with de...
Arshad Jhumka, Martin Hiller, Neeraj Suri
DASFAA
2008
IEEE
149views Database» more  DASFAA 2008»
15 years 4 months ago
A Test Paradigm for Detecting Changes in Transactional Data Streams
A pattern is considered useful if it can be used to help a person to achieve his goal. Mining data streams for useful patterns is important in many applications. However, data stre...
Willie Ng, Manoranjan Dash
131
Voted
FLAIRS
2009
15 years 1 months ago
Unit Testing for Qualitative Spatial and Temporal Reasoning
Researchers in commonsense, qualitative spatial and temporal reasoning (QSTR) provide flexible and intuitive methods for reasoning about vague and uncertain information including ...
Carl P. L. Schultz, Robert Amor, Hans W. Guesgen
128
Voted
TAP
2007
Springer
92views Hardware» more  TAP 2007»
15 years 9 months ago
Generating Unit Tests from Formal Proofs
We present a new automatic test generation method for JAVA CARD based on attempts at formal verification of the implementation under test (IUT). Self-contained unit tests in JUnit...
Christian Engel, Reiner Hähnle