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98
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COMCOM
1999
124views more  COMCOM 1999»
15 years 3 months ago
Minimizing the Cost of Fault Location when Testing from a Finite State Machine
If a test does not produce the expected output, the incorrect output may have been caused by an earlier state transfer failure. Ghedamsi and von Bochmann [1992] and Ghedamsi et al...
Robert M. Hierons
119
Voted
DSD
2006
IEEE
126views Hardware» more  DSD 2006»
15 years 9 months ago
Off-Line Testing of Delay Faults in NoC Interconnects
Testing of high density SoCs operating at high clock speeds is an important but difficult problem. Many faults, like delay faults, in such sub-micron chips may only appear when th...
Tomas Bengtsson, Artur Jutman, Shashi Kumar, Raimu...
138
Voted
SFP
2003
15 years 5 months ago
Testing Scheme programming assignments automatically
Abstract In distance learning the lack of direct communication between teachers and learners makes it difficult to provide direct assistance to students while they are solving the...
Manfred Widera
SIGMOD
2006
ACM
89views Database» more  SIGMOD 2006»
16 years 3 months ago
Testing database applications
Testing of database applications is crucial for ensuring high software quality as undetected faults can result in unrecoverable data corruption. The problem of database applicatio...
Carsten Binnig, Donald Kossmann, Eric Lo
128
Voted
AAAI
2007
15 years 6 months ago
Adaptive Traitor Tracing with Bayesian Networks
The practical success of broadcast encryption hinges on the ability to (1) revoke the access of compromised keys and (2) determine which keys have been compromised. In this work w...
Philip Zigoris, Hongxia Jin