Abstract: Test methodologies for large embedded systems fail to reflect the test process as a whole. Instead, the test process is divided into independent test levels feaifferences...
Despite the growing interest for component-based systems, few works tackle the question of the trust we can bring into a component. This paper presents a method and a tool for bui...
In this paper, an analysis of test time by CBET (which is an acronym for Combination of BIST and External Test) test approach is presented. The analysis validates that CBET test a...
Many machine learning tasks contain feature evaluation as one of its important components. This work is concerned with attribute estimation in the problems where class distribution...