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2010
15 years 5 months ago
Multi-Level Test Models for Embedded Systems
Abstract: Test methodologies for large embedded systems fail to reflect the test process as a whole. Instead, the test process is divided into independent test levels feaifferences...
Abel Marrero Pérez, Stefan Kaiser
151
Voted
ISSRE
2000
IEEE
15 years 8 months ago
Building Trust into OO Components Using a Genetic Analogy
Despite the growing interest for component-based systems, few works tackle the question of the trust we can bring into a component. This paper presents a method and a tool for bui...
Benoit Baudry, Vu Le Hanh, Jean-Marc Jéz&ea...
DATE
2000
IEEE
86views Hardware» more  DATE 2000»
15 years 8 months ago
Analysis and Minimization of Test Time in a Combined BIST and External Test Approach
In this paper, an analysis of test time by CBET (which is an acronym for Combination of BIST and External Test) test approach is presented. The analysis validates that CBET test a...
Makoto Sugihara, Hiroto Yasuura, Hiroshi Date
TC
2002
15 years 3 months ago
Test Bus Sizing for System-on-a-Chip
Vikram Iyengar, Krishnendu Chakrabarty
ECML
2003
Springer
15 years 9 months ago
Experiments with Cost-Sensitive Feature Evaluation
Many machine learning tasks contain feature evaluation as one of its important components. This work is concerned with attribute estimation in the problems where class distribution...
Marko Robnik-Sikonja