21183 search results - page 46 / 4237 » Adaptive Testing by Test |
382
Voted
IWQOS
2011
Springer
14 years 6 months ago
2011
Springer
Abstract—Cloud systems provide a cost-effective service hosting infrastructure for application service providers (ASPs). However, cloud systems are often shared by multiple tenan...
134
Voted
DSD
2009
IEEE
15 years 10 months ago
2009
IEEE
—Long test application time and high temperature have become two major issues of system-on-chip (SoC) test. In order to minimize test application times and avoid overheating duri...
133
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HICSS
2007
IEEE
15 years 10 months ago
2007
IEEE
Software can be tested either manually or automatically. The two approaches are complementary: automated testing can perform a large number of tests in little time, whereas manual...
142
Voted
ATS
2005
IEEE
15 years 9 months ago
2005
IEEE
11 Due to the increasing test data volume needed to test corebased System-on-Chip, several test scheduling techniques minimizing the test application time have been proposed. In co...
138
Voted
VLSI
2005
Springer
15 years 9 months ago
2005
Springer
1 The increasing test data volume required to ensure high test quality when testing a System-on-Chip is becoming a problem since it (the test data volume) must fit the ATE (Automa...