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136
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FORTE
2004
15 years 5 months ago
2004
Software Model-Checking and Testing are some of the most used techniques to analyze software systems and identify hidden faults. While software model-checking allows for an exhaust...
163
Voted
DAC
2005
ACM
16 years 4 months ago
2005
ACM
The challenge of verifying a modern microprocessor design is an overwhelming one: Increasingly complex micro-architectures combined with heavy time-to-market pressure have forced ...
108
Voted
ESEM
2007
ACM
15 years 7 months ago
2007
ACM
This short paper reports a pilot experiment conducted with master students, in which we investigated whether Fit test cases were helpful to clarify change requirements in a mainte...
105
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JOT
2007
15 years 3 months ago
2007
Nothing does a software company’s reputation more harm than poor quality. One significant contributor to delivered quality is how thoroughly the software is tested. In this issu...
132
Voted
VTS
2008
IEEE
15 years 10 months ago
2008
IEEE
—Wafer-level test during burn-in (WLTBI) is a promising technique to reduce test and burn-in costs in semiconductor manufacturing. However, scan-based testing leads to significa...