VTS 2008 IEEE VLSI Test Symposium
 |  |
Wall of Fame | Most Viewed VTS-2008 Paper
VTS
2008
IEEE
14 years 5 months ago
2008
IEEE
Timing-related defects are becoming increasingly important in nanometer technology designs. Small delay variations induced by crosstalk, process variations, powersupply noise, as ...
Disclaimer and Copyright Notice
Sciweavers respects the rights of all copyright holders and in this regard, authors are only allowed to share a link to their preprint paper on their own website.
Every contribution is associated with a desciptive image. It is the sole responsibility of the authors to ensure that their posted image is not copyright infringing. This service is compliant with IEEE copyright.
| Id | Read | Views | Title | Status |
|---|---|---|---|---|
| 1 |  | 136 | ||
| 2 | | 119 | ||
| 3 | | 104 | ||
| 4 | | 94 | ||
| 5 | | 83 | ||
| 6 | | 81 | ||
| 7 | | 78 | ||
| 8 | | 77 | ||
| 9 | | 70 |