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ICCAD
2010
IEEE
121views Hardware» more  ICCAD 2010»
15 years 2 months ago
Multi-Wafer Virtual Probe: Minimum-cost variation characterization by exploring wafer-to-wafer correlation
In this paper, we propose a new technique, referred to as MultiWafer Virtual Probe (MVP) to efficiently model wafer-level spatial variations for nanoscale integrated circuits. Tow...
Wangyang Zhang, Xin Li, Emrah Acar, Frank Liu, Rob...
ICDM
2010
IEEE
125views Data Mining» more  ICDM 2010»
15 years 2 months ago
Mining Arabic Business Reviews
For languages with rich content over the web, business reviews are easily accessible via many known websites, e.g., Yelp.com. For languages with poor content over the web like Arab...
Mohamed Elhawary, Mohamed G. Elfeky
ICIP
2010
IEEE
15 years 2 months ago
Reduced-reference SSIM estimation
The structural similarity (SSIM) index has been shown to be a good perceptual image quality predictor. In many real-world applications such as network visual communications, howev...
Abdul Rehman, Zhou Wang
ICIP
2010
IEEE
15 years 2 months ago
Explore multiple clues for urban images matching
Many well-known existing image matching methods are based on local texture analysis, and consequently have difficulty handling low-textured 3D objects, such as those man-made buil...
Quan Wang, Suya You
ICIP
2010
IEEE
15 years 2 months ago
Shape from shading for hybrid surfaces as applied to tooth reconstruction
Accurate 3-D modeling of the human teeth helps patients avoid the discomfort of the mold process, and improves the data accuracy for oral surgeons, orthodontists and dental care p...
Cambron N. Carter, Rosario J. Pusateri, Dongqing C...
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