1728 search results - page 34 / 346 » Advanced empirical testing |
AAAI
1996
13 years 11 months ago
1996
Previous work suggests that reminding a conversational partner of mutually known information depends on the conversants' attentional state, their resource limits and the reso...
IJCAI
1989
13 years 11 months ago
1989
In real-world domains a concept to be learned may be unwieldy and the environment may be less than ideal. One combination of difficulties occurs if the concept is probabilistic an...
SIGOPS
2010
13 years 8 months ago
2010
Reports of NAND flash device testing in the literature have for the most part been limited to examination of circuit-level parameters on raw flash chips or prototypes, and syste...
ESEM
2007
ACM
14 years 1 months ago
2007
ACM
This paper presents a controlled experiment comparing the defect detection efficiency of exploratory testing (ET) and test case based testing (TCT). While traditional testing lite...
DATE
2008
IEEE
2008
IEEE
State Skip LFSRs: Bridging the Gap between Test Data Compression and Test Set Embedding for IP Cores
13 years 11 months ago
1 We present a new type of Linear Feedback Shift Registers, State Skip LFSRs. State Skip LFSRs are normal LFSRs with the addition of a small linear circuit, the State Skip circuit,...