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SCAM
2008
IEEE
14 years 4 months ago
Constructing Subtle Faults Using Higher Order Mutation Testing
Traditional mutation testing considers only first order mutants, created by the injection of a single fault. Often these first order mutants denote trivial faults that are easil...
Yue Jia, Mark Harman
DAC
1996
ACM
14 years 2 months ago
Pseudorandom-Pattern Test Resistance in High-Performance DSP Datapaths
The testability of basic DSP datapath structures using pseudorandom built-in self-test techniques is examined. The addition of variance mismatched signals is identified as a testi...
Laurence Goodby, Alex Orailoglu
JMIV
2010
85views more  JMIV 2010»
13 years 8 months ago
Statistical Tests of Anisotropy for Fractional Brownian Textures. Application to Full-field Digital Mammography
In this paper, we propose a new and generic methodology for the analysis of texture anisotropy. The methodology is based on the stochastic modeling of textures by anisotropic fract...
Frédéric J. P. Richard, Hermine Bier...
APSEC
2010
IEEE
13 years 5 months ago
Testing Inter-layer and Inter-task Interactions in RTES Applications
Abstract--Real-time embedded systems (RTESs) are becoming increasingly ubiquitous, controlling a wide variety of popular and safety-critical devices. Effective testing techniques c...
Ahyoung Sung, Witawas Srisa-an, Gregg Rothermel, T...
ISPW
2006
IEEE
14 years 4 months ago
Automated Recognition of Low-Level Process: A Pilot Validation Study of Zorro for Test-Driven Development
Abstract. Zorro is a system designed to automatically determine whether a developer is complying with the Test-Driven Development (TDD) process. Automated recognition of TDD could ...
Hongbing Kou, Philip M. Johnson