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ICCD
2008
IEEE
202views Hardware» more  ICCD 2008»
14 years 3 months ago
CrashTest: A fast high-fidelity FPGA-based resiliency analysis framework
— Extreme scaling practices in silicon technology are quickly leading to integrated circuit components with limited reliability, where phenomena such as early-transistor failures...
Andrea Pellegrini, Kypros Constantinides, Dan Zhan...
EVOW
2010
Springer
14 years 1 months ago
Parameter Tuning of Evolutionary Algorithms: Generalist vs. Specialist
Abstract. Finding appropriate parameter values for Evolutionary Algorithms (EAs) is one of the persistent challenges of Evolutionary Computing. In recent publications we showed how...
Selmar K. Smit, A. E. Eiben
IPSN
2010
Springer
14 years 1 months ago
Diagnostic powertracing for sensor node failure analysis
Troubleshooting unresponsive sensor nodes is a significant challenge in remote sensor network deployments. This paper introduces the tele-diagnostic powertracer, an in-situ troub...
Mohammad Maifi Hasan Khan, Hieu Khac Le, Michael L...
ICS
2009
Tsinghua U.
14 years 1 months ago
QuakeTM: parallelizing a complex sequential application using transactional memory
“Is transactional memory useful?” is the question that cannot be answered until we provide substantial applications that can evaluate its capabilities. While existing TM appli...
Vladimir Gajinov, Ferad Zyulkyarov, Osman S. Unsal...
NDSS
2008
IEEE
14 years 1 months ago
Automated Whitebox Fuzz Testing
Fuzz testing is an effective technique for finding security vulnerabilities in software. Traditionally, fuzz testing tools apply random mutations to well-formed inputs of a progr...
Patrice Godefroid, Michael Y. Levin, David A. Moln...