480 search results - page 51 / 96 » Algorithmic tests and randomness with respect to a class of ... |
JC
2007
13 years 7 months ago
2007
We construct simple algorithms for high-dimensional numerical integration of function classes with moderate smoothness. These classes consist of square-integrable functions over t...
BMCBI
2007
13 years 7 months ago
2007
Background: When analysing microarray and other small sample size biological datasets, care is needed to avoid various biases. We analyse a form of bias, stratification bias, that...
ICCV
2007
IEEE
14 years 9 months ago
2007
IEEE
We study the beneficial effect of side information on the Structure from Motion (SfM) estimation problem. The side information that we consider is measurement of a `reference vect...
EVOW
2008
Springer
13 years 9 months ago
2008
Springer
Automatic Defect Classification (ADC) is a well-developed technology for inspection and measurement of defects on patterned wafers in the semiconductors industry. The poor training...
ICCVW
1999
Springer
13 years 12 months ago
1999
Springer
Image-based reconstruction from randomly scattered views is a challenging problem. We present a new algorithm that extends Seitz and Dyer’s Voxel Coloring algorithm. Unlike their...