2451 search results - page 101 / 491 » Alternative Test Methods Using IEEE 1149.4 |
ICIP
2000
IEEE
14 years 10 months ago
2000
IEEE
New rotationally invariant texture feature extraction methods are introduced that utilise the dual tree complex wavelet transform (DT-CWT). The complex wavelet transform is a new ...
WCRE
2006
IEEE
14 years 3 months ago
2006
IEEE
Requirements views, such as coverage and status views, are an important asset for monitoring and managing software development. We have developed a method that automates the proce...
ITC
2000
IEEE
14 years 20 days ago
2000
IEEE
1 The term "functional BIST" describes a test method to control functional modules so that they generate a deterministic test set, which targets structural faults within ...
ETS
2010
IEEE
13 years 10 months ago
2010
IEEE
Testing of 3D stacked ICs (SICs) is becoming increasingly important in the semiconductor industry. In this paper, we address the problem of test architecture optimization for 3D s...
ICDM
2006
IEEE
14 years 3 months ago
2006
IEEE
Clustering is ill-defined. Unlike supervised learning where labels lead to crisp performance criteria such as accuracy and squared error, clustering quality depends on how the cl...