2451 search results - page 104 / 491 » Alternative Test Methods Using IEEE 1149.4 |
ICCV
1998
IEEE
14 years 11 months ago
1998
IEEE
`Invariant regions' are image patches that automatically deform with changing viewpoint as to keep on covering identical physical parts of a scene. Such regions are then desc...
ENC
2006
IEEE
14 years 23 days ago
2006
IEEE
In this work, by using the local node refinement technique purposed in [2, 1], and a quad-tree type algorithm [3, 13], we built a global refinement technique for Kansa's unsy...
ICCAD
1997
IEEE
14 years 1 months ago
1997
IEEE
Asynchronous circuits operate correctly only under timing assumptions. Hence testing those circuits for delay faults is crucial. This paper describes a three-step method to detect...
KBSE
2007
IEEE
14 years 3 months ago
2007
IEEE
We describe a model-based construction of an online tester for black-box testing of implementation under test (IUT). The external behavior of the IUT is modeled as an output obser...
APSEC
1996
IEEE
14 years 1 months ago
1996
IEEE
Testing of concurrent programs is much more difficult than that of sequential programs. A concurrent program behaves nondeterministically, that is, the program may produce differe...