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» Alternative Test Methods Using IEEE 1149.4
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ICCD
2008
IEEE
111views Hardware» more  ICCD 2008»
14 years 6 months ago
Test-access mechanism optimization for core-based three-dimensional SOCs
— Test-access mechanisms (TAMs) and test wrappers (e.g., the IEEE Standard 1500 wrapper) facilitate the modular testing of embedded cores in a core-based system-on-chip (SOC). Su...
Xiaoxia Wu, Yibo Chen, Krishnendu Chakrabarty, Yua...
ICIP
2002
IEEE
14 years 10 months ago
A method for color naming and description of color composition in images
Color is one of the main visual cues and has been frequently used in image processing, analysis and retrieval. The extraction of highlevel color descriptors is an increasingly imp...
Aleksandra Mojsilovic
ISBI
2006
IEEE
14 years 10 months ago
Improved comparison of protein subcellular location patterns
* A common task in cell and molecular biology is to evaluate the difference or similarity among location patterns under different circumstances. Our previous work has described an...
Ting Zhao, Stalia Soto, Robert F. Murphy
GLVLSI
2003
IEEE
161views VLSI» more  GLVLSI 2003»
14 years 2 months ago
TEM-cell and surface scan to identify the electromagnetic emission of integrated circuits
The characterization as well as the control of the electromagnetic emission of integrated circuits is an important step in the design process of state of the art integrated circui...
Timm Ostermann, Bernd Deutschmann
IJCNN
2007
IEEE
14 years 3 months ago
Distance-based Disagreement Classifiers Combination
— We present a methodology to analyze Multiple Classifiers Systems (MCS) performance, using the diversity concept. The goal is to define an alternative approach to the convention...
Cinthia Obladen de Almendra Freitas, João M...