2451 search results - page 1 / 491 » Alternative Test Methods Using IEEE 1149.4 |
DATE
2000
IEEE
14 years 14 hour ago
2000
IEEE
ATS
2004
IEEE
13 years 11 months ago
2004
IEEE
Test data volume and scan power are two major concerns in SoC test. In this paper we present an alternative run-length coding method through scan chain reconfiguration to reduce b...
ATS
2004
IEEE
13 years 11 months ago
2004
IEEE
An efficient design for test methodology to increase the test yield of analog circuits is presented. It is assumed that the analog circuits are tested using alternate tests that r...
CSB
2002
IEEE
14 years 17 days ago
2002
IEEE
Understanding the functional significance of alternative splicing and other mechanisms that generate RNA transcript diversity is an important challenge facing modern-day molecular...
ETS
2006
IEEE
14 years 1 months ago
2006
IEEE
— Accurate generation of circuit specifications from test signatures is a difficult problem, since analytical expressions cannot precisely describe the nonlinear relationships ...