2451 search results - page 67 / 491 » Alternative Test Methods Using IEEE 1149.4 |
ETS
2007
IEEE
14 years 2 months ago
2007
IEEE
The paper proposes a new concept of diagnosing faulty links in Network-on-a-Chip (NoC) designs. The method is based on functional fault models and it implements packet address dri...
ICPR
2010
IEEE
13 years 11 months ago
2010
IEEE
A non-iterative method of image super-resolution based on weighted median filtering with Gaussian weights is proposed. Visual tests and basic edges metrics were used to examine th...
METRICS
2003
IEEE
14 years 1 months ago
2003
IEEE
When it is impractical to rigorously assess all parts of complex systems, test engineers use defect detectors to focus their limited resources. In this article, we define some pr...
ISBI
2011
IEEE
12 years 11 months ago
2011
IEEE
In imaging genomics, there have been rapid advances in genome-wide, image-wide searches for genes that influence brain structure. Most efforts focus on univariate tests that treat...
DATE
2003
IEEE
14 years 1 months ago
2003
IEEE
Test is often seen as a necessary evil; it is a fact of life that ICs have manufacturing defects and those need to be filtered out by testing before the ICs are shipped to the cu...