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» Alternative Test Methods Using IEEE 1149.4
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VTS
2000
IEEE
113views Hardware» more  VTS 2000»
14 years 1 months ago
Hidden Markov and Independence Models with Patterns for Sequential BIST
We propose a novel BIST technique for non-scan sequential circuits which does not modify the circuit under test. It uses a learning algorithm to build a hardware test sequence gen...
Laurent Bréhélin, Olivier Gascuel, G...
LCN
2002
IEEE
14 years 2 months ago
RAMON: Rapid-Mobility Network Emulator
In wireless networks, as in many areas of engineering, simulation has been the de-facto standard for testing, dimensioning and analyzing mobile protocols. Emulation, which present...
Edwin Hernandez, Abdelsalam Helal
ICST
2009
IEEE
13 years 6 months ago
Putting Formal Specifications under the Magnifying Glass: Model-based Testing for Validation
A software development process is conceptually an abstract form of model transformation, starting from an enduser model of requirements, through to a system model for which code c...
Emine G. Aydal, Richard F. Paige, Mark Utting, Jim...
DATE
2002
IEEE
169views Hardware» more  DATE 2002»
14 years 2 months ago
Built-In Dynamic Current Sensor for Hard-to-Detect Faults in Mixed-Signal Ics
There are some types of faults in analogue and mixed signal circuits which are very difficult to detect using either voltage or current based test methods. However, it is possible...
Yolanda Lechuga, Román Mozuelos, Mar Mart&i...
CORR
2000
Springer
128views Education» more  CORR 2000»
13 years 9 months ago
Faster Evaluation of Multidimensional Integrals
In a recent paper Keister proposed two quadrature rules as alternatives to Monte Carlo for certain multidimensional integrals and reported his test results. In earlier work we had...
Anargyros Papageorgiou, Joseph F. Traub