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DAC
2008
ACM
14 years 10 months ago
Study of the effects of MBUs on the reliability of a 150 nm SRAM device
1 Soft errors induced by radiation are an increasing problem in the microelectronic field. Although traditional models estimate the reliability of memories suffering Single Event U...
Juan Antonio Maestro, Pedro Reviriego
CJ
2004
141views more  CJ 2004»
13 years 8 months ago
Modeling and Analysis of a Scheduled Maintenance System: a DSPN Approach
This paper describes a way to manage the modeling and analysis of Scheduled Maintenance Systems (SMS) within an analytically tractable context. We chose a significant case study h...
Andrea Bondavalli, Roberto Filippini
ICPR
2010
IEEE
14 years 2 months ago
The Detection of Concept Frames Using Clustering Multi-Instance Learning
Abstract—The classification of sequences requires the combination of information from different time points. In this paper the detection of facial expressions is considered. Exp...
David Tax, Michel Valstar
ASWEC
2010
IEEE
13 years 9 months ago
On the Use of Properties in Java Applications
—When building software systems, developers have to weigh the benefits of using one specific solution approach against the risks and costs of using another one. This process is...
Markus Lumpe, Samrian Mahmud, Rajesh Vasa
ICIP
2009
IEEE
13 years 6 months ago
Robust object tracking using correspondence voting for smart surveillance visual sensing nodes
This paper presents a bottom-up tracking algorithm for surveillance applications where speed and reliability in the case of multiple matches and occlusions are major concerns. The...
Mayssaa Al Najjar, Soumik Ghosh, Magdy Bayoumi