39 search results - page 6 / 8 » An Automatic Test Pattern Generator for Large Sequential Cir... |
HPDC
2005
IEEE
14 years 2 months ago
2005
IEEE
good data partitioning scheme is the need of the time. However it is very diflcult to arrive at a good solution as the number of possible dutupartitionsfor a given real lifeprogra...
DDECS
2007
IEEE
14 years 2 months ago
2007
IEEE
— Recently, there is a renewed interest in Automatic Test Pattern Generation (ATPG) based on Boolean Satisfiability (SAT). This results from the availability of very powerful SA...
JSS
2008
13 years 7 months ago
2008
This report presents a model-driven, stress test methodology aimed at increasing chances of discovering faults related to network traffic in Distributed Real-Time Systems (DRTS). T...
GECCO
2003
Springer
14 years 1 months ago
2003
Springer
Evolutionary Testing (ET) has been shown to be very successful for testing real world applications [10]. The original ET approach focusesonsearching for a high coverage of the test...
ICES
2000
Springer
14 years 4 days ago
2000
Springer
Testing is a key issue in the design and production of digital circuits: the adoption of BIST (Built-In Self-Test) techniques is increasingly popular, but requires efficient algori...