482 search results - page 16 / 97 » An Effective Diagnosis Method to Support Yield Improvement |
DAS
2010
Springer
14 years 1 days ago
2010
Springer
We consider the problem of dealing with irrelevant votes when a multi-case classifier is built from an ensemble of binary classifiers. We show how run-off elections can be used to...
ASPDAC
2006
ACM
14 years 2 months ago
2006
ACM
- Reducing the yield loss due to via failure is one of the important problems in design for manufacturability. A well known and highly recommended method to improve via yield/relia...
BMCBI
2010
13 years 8 months ago
2010
Background: Maximizing the utility of DNA microarray data requires optimization of data acquisition through selection of an appropriate scanner setting. To increase the amount of ...
CORR
2010
Springer
13 years 8 months ago
2010
Springer
The main focus of image mining in the proposed method is concerned with the classification of brain tumor in the CT scan brain images. The major steps involved in the system are: p...
DAC
2010
ACM
14 years 19 days ago
2010
ACM
With the ever-increasing transistor variability in CMOS technology, it is essential to integrate variation-aware performance analysis into the task allocation and scheduling proce...