60 search results - page 3 / 12 » An Efficient Technique to Detect Visual Defects in Particleb... |
IFIP
2001
Springer
14 years 3 days ago
2001
Springer
: High defect coverage requires good coverage of different fault types. In this paper, we present a comprehensive test vector generation technique for BIST, called Random Single In...
PICS
2003
13 years 9 months ago
2003
This study examines the prediction of print defect perception (banding) of the human visual system (HVS) by combining detection probabilities of contrast components from wavelet a...
ICSE
2001
IEEE-ACM
14 years 3 days ago
2001
IEEE-ACM
Global software development challenges traditional techniques of software engineering, such as peer reviews or teamwork. Effective teamwork and coaching of engineers highly contri...
DATE
2009
IEEE
14 years 2 months ago
2009
IEEE
Abstract-Multi-detect (N-detect) testing suffers from the drawback that its test length grows linearly with N. We present a new method to generate compact test sets that provide hi...
DAC
2000
ACM
14 years 8 months ago
2000
ACM
The effect of crosstalk errors is most significant in highperformance circuits, mandating at-speed testing for crosstalk defects. This paper describes a self-test methodology that...