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DAC
2010
ACM
13 years 11 months ago
2010
ACM
Fault simulation is essential in test generation, design for test and reliability assessment of integrated circuits. Reliability analysis and the simulation of self-test structure...
VLSISP
2011
13 years 3 months ago
2011
Machine-learning algorithms are employed in a wide variety of applications to extract useful information from data sets, and many are known to suffer from superlinear increases in ...
ICCV
2009
IEEE
15 years 1 months ago
2009
IEEE
In this paper we explore the use of shapes of noses for
performing partial human biometrics. The basic idea is to
represent nasal surfaces using indexed collections of isocurves,...
LCN
2002
IEEE
14 years 1 months ago
2002
IEEE
Overall efficiency of high-performance computing clusters not only relies on the computing power of the individual nodes, but also on the performance that the underlying network c...
ICPR
2010
IEEE
14 years 11 days ago
2010
IEEE
Semantic analysis of a document collection can be viewed as an unsupervised clustering of the constituent words and documents around hidden or latent concepts. This has shown to i...