The importance of an interconnect pattern density model in ASIC design flow for a 90nm technology is presented. It is shown that performing the timing analysis at the worst-case c...
Payman Zarkesh-Ha, S. Lakshminarayann, Ken Doniger...
We propose a novel design flow for mismatch and processvariation aware optimization of nanoscale CMOS Active Pixel Sensor (APS) arrays. As a case study, an 8 × 8 APS array is de...
Circuit reliability is affected by various fabrication-time and run-time effects. Fabrication-induced process variation has significant impact on circuit performance and reliabilit...
Yinghai Lu, Li Shang, Hai Zhou, Hengliang Zhu, Fan...
Architectural quality constitutes a critical factor for contemporary software systems, especially because of their size and the needs for frequent, quick changes. For success-crit...
Automated processing and analysis of video recordings of neonatal seizures can generate novel methods for extracting quantitative information that is relevant only to the seizure [...