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ISQED
2003
IEEE
133views Hardware» more  ISQED 2003»
14 years 19 days ago
Impact of Interconnect Pattern Density Information on a 90nm Technology ASIC Design Flow
The importance of an interconnect pattern density model in ASIC design flow for a 90nm technology is presented. It is shown that performing the timing analysis at the worst-case c...
Payman Zarkesh-Ha, S. Lakshminarayann, Ken Doniger...
ISQED
2009
IEEE
91views Hardware» more  ISQED 2009»
14 years 2 months ago
Variability-aware optimization of nano-CMOS Active Pixel Sensors using design and analysis of Monte Carlo experiments
We propose a novel design flow for mismatch and processvariation aware optimization of nanoscale CMOS Active Pixel Sensor (APS) arrays. As a case study, an 8 × 8 APS array is de...
Dhruva Ghai, Saraju P. Mohanty, Elias Kougianos
DAC
2009
ACM
14 years 8 months ago
Statistical reliability analysis under process variation and aging effects
Circuit reliability is affected by various fabrication-time and run-time effects. Fabrication-induced process variation has significant impact on circuit performance and reliabilit...
Yinghai Lu, Li Shang, Hai Zhou, Hengliang Zhu, Fan...
ECBS
2007
IEEE
135views Hardware» more  ECBS 2007»
14 years 1 months ago
Introducing Impact Analysis for Architectural Decisions
Architectural quality constitutes a critical factor for contemporary software systems, especially because of their size and the needs for frequent, quick changes. For success-crit...
Matthias Riebisch, Sven Wohlfarth
AVSS
2003
IEEE
14 years 20 days ago
Improving the Extraction of Temporal Motion Strength Signals from Video Recordings of Neonatal Seizures
Automated processing and analysis of video recordings of neonatal seizures can generate novel methods for extracting quantitative information that is relevant only to the seizure [...
Nicolaos B. Karayiannis, Guozhi Tao