When search results against digital libraries and web resources have limited metadata, augmenting them with meaningful and stable category information can enable better overviews ...
Growing test data volume and overtesting caused by excessive scan capture power are two of the major concerns for the industry when testing large integrated circuits. Various test...
Today, many formal analysis tools are not only used to provide certainty but are also used to debug software systems – a role that has traditional been reserved for testing tool...
Object-oriented unit tests consist of sequences of method invocations. Behavior of an invocation depends on the method’s arguments and the state of the receiver at the beginning ...
Tao Xie, Darko Marinov, Wolfram Schulte, David Not...
— We propose an automatic test pattern generation (ATPG) framework for combinational threshold networks. The motivation behind this work lies in the fact that many emerging nanot...