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DAC
2000
ACM
14 years 10 months ago
Test challenges for deep sub-micron technologies
The use of deep submicron process technologies presents several new challenges in the area of manufacturing test. While a significant body of work has been devoted to identifying ...
Kwang-Ting Cheng, Sujit Dey, Mike Rodgers, Kaushik...
3DIM
2005
IEEE
14 years 2 months ago
Accuracy of 3D Scanning Technologies in a Face Scanning Scenario
In this paper, we will review several different 3D scanning devices. We will present a method for empirical accuracy analysis, and apply it to several scanners providing an overvi...
Chris Boehnen, Patrick J. Flynn
EEE
2005
IEEE
14 years 2 months ago
Overview on Decentralized Establishment of Consistent Multi-Lateral Collaborations Based on Asynchronous Communication
Service oriented architectures facilitate loosely coupled collaborations, which are established in a decentralized way. One challenge for such collaborations is to guarantee consi...
Andreas Wombacher, Peter Fankhauser, Karl Aberer
CLEF
2010
Springer
13 years 9 months ago
Overview of ResPubliQA 2010: Question Answering Evaluation over European Legislation
This paper describes the second round of ResPubliQA, a Question Answering (QA) evaluation task over European legislation, a LAB of CLEF 2010. Two tasks have been proposed this year...
Anselmo Peñas, Pamela Forner, Álvaro...
IGARSS
2009
13 years 6 months ago
DubaiSat-1: Mission Overview, Development Status and Future Applications
DubaiSat-1 is an initiative from Emirates Institution for Advanced Science and Technology (EIAST) to start the first Earth observation satellite program in the United Arab Emirate...
Adnan Al Rais, Ali Al Suwaidi, Hosni Ghedira