5203 search results - page 976 / 1041 » An approach to workflow modeling and analysis |
DATE
2003
IEEE
14 years 2 months ago
2003
IEEE
Test is often seen as a necessary evil; it is a fact of life that ICs have manufacturing defects and those need to be filtered out by testing before the ICs are shipped to the cu...
SIGIR
2003
ACM
14 years 2 months ago
2003
ACM
In a federated digital library system, it is too expensive to query every accessible library. Resource selection is the task to decide to which libraries a query should be routed....
KDD
2000
ACM
14 years 15 days ago
2000
ACM
We describe an application of data mining and decision analysis to the problem of die-level functional test in integrated circuit manufacturing. Integrated circuits are fabricated...
CASES
2008
ACM
13 years 11 months ago
2008
ACM
Detailed or cycle-accurate/bit-accurate (CABA) simulation is a critical phase in the design flow of embedded systems. However, with increasing system complexity, full detailed sim...
CEC
2010
IEEE
13 years 10 months ago
2010
IEEE
Abstract-- Exploring microRNA (miRNA) and mRNA regulatory interactions may give new insights into diverse biological phenomena. While elucidating complex miRNA-mRNA interactions ha...