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ITC
1998
IEEE
174views Hardware» more  ITC 1998»
13 years 12 months ago
High volume microprocessor test escapes, an analysis of defects our tests are missing
This paper explores defects found in a high volume microprocessor when shipping at a low defect level. A brief description of the manufacturing flow along with definition of DPM i...
Wayne M. Needham, Cheryl Prunty, Yeoh Eng Hong
JCDL
2005
ACM
84views Education» more  JCDL 2005»
14 years 1 months ago
Turning the page on navigation
In this paper, we discuss the findings of an in-depth observational study of reading and within-document navigation and add to these findings the results of a second analysis of h...
Catherine C. Marshall, Sara A. Bly
HICSS
2002
IEEE
113views Biometrics» more  HICSS 2002»
14 years 18 days ago
Designing and Examining PC to Palm Collaboration
One trend in day-to-day computing involves moving seamlessly from large powerful workstations to small handheld devices. A second trend is continuous collaboration with colleagues...
Ivan Marsic, Allan Meng Krebs, Bogdan Dorohonceanu...
VLDB
1995
ACM
112views Database» more  VLDB 1995»
13 years 11 months ago
OPOSSUM: Desk-Top Schema Management through Customizable Visualization
Several recent trends have changed the usage and users of schemas beyond those of a database administrator’s tool for describing database contents. Distribution of computing pow...
Eben M. Haber, Yannis E. Ioannidis, Miron Livny
NOCS
2007
IEEE
14 years 1 months ago
Transaction-Based Communication-Centric Debug
Abstract— The behaviour of systems on chip (SOC) is complex because they contain multiple processors that interact through concurrent interconnects, such as networks on chip (NOC...
Kees Goossens, Bart Vermeulen, Remco van Steeden, ...