135 search results - page 25 / 27 » Analog circuit test based on a digital signature |
PROMISE
2010
13 years 2 months ago
2010
Background: There are many data mining methods but few comparisons between them. For example, there are at least two ways to build quality optimizers, programs that find project o...
TVLSI
2008
13 years 7 months ago
2008
Exact approaches to combinational equivalence checking, such as automatic test pattern generation-based, binary decision diagrams (BDD)-based, satisfiability-based, and hybrid appr...
FPGA
2009
ACM
14 years 2 months ago
2009
ACM
Modern Field Programmable Gate Arrays (FPGAs) are capable of performing complex discrete signal processing algorithms with clock rates above 100MHz. This combined with FPGA’s lo...
ASPDAC
2004
ACM
14 years 26 days ago
2004
ACM
— We have developed the first real-time 3-D image sensor with VGA pixel resolution using mixed-signal techniques to achieve high-speed and high-accuracy range calculation based ...
IEICET
2008
13 years 7 months ago
2008
This paper studies impact of the well edge proximity effect on digital circuit delay, based on model parameters extracted from test structures in an industrial 65nm wafer process. ...