85 search results - page 6 / 17 » Analysis and Detection of Timing Failures in an Experimental... |
VTS
2000
IEEE
13 years 12 months ago
2000
IEEE
The performance of deep sub-micron designs can be affected by various parametric variations, manufacturing defects, noise or even modeling errors that are all statistical in natur...
IISWC
2009
IEEE
14 years 2 months ago
2009
IEEE
In many areas such as e-commerce, mission-critical N-tier applications have grown increasingly complex. They are characterized by non-stationary workloads (e.g., peak load several...
SIGARCH
2008
13 years 7 months ago
2008
This paper presents a parallelization framework for emerging applications on the future chip multiprocessors (CMPs). With the continuing prevalence of CMP and the number of on-die...
LREC
2008
13 years 9 months ago
2008
The development of natural language processing (NLP) components is resource-intensive and therefore justifies exploring ways of reducing development time and effort when building ...
DATE
2009
IEEE
14 years 2 months ago
2009
IEEE
Soft errors in combinational and sequential elements of digital circuits are an increasing concern as a result of technology scaling. Several techniques for gate and latch hardeni...