As process technology migrates to deep submicron with feature size less than 100nm, global wire delay is becoming a major hindrance in keeping the latency of intra-chip communicat...
Mongkol Ekpanyapong, Jacob R. Minz, Thaisiri Watew...
Capacitance extraction is an important problem that has been extensively studied. This paper presents a significant improvement for the fast multipole accelerated boundary element...
We present a new methodology which takes into consideration the effect of Within-Die (WID) process variations on a low-voltage parallel system. We show that in the presence of pro...
Navid Azizi, Muhammad M. Khellah, Vivek De, Farid ...
This paper presents an efficient hierarchical 3D capacitance extraction algorithm -- ICCAP. Most previous capacitance extraction algorithms introduce intermediate variables to fac...
Physical phenomena such as temperature have an increasingly important role in performance and reliability of modern process technologies. This trend will only strengthen with futu...
Rajarshi Mukherjee, Seda Ogrenci Memik, Gokhan Mem...