Double Patterning Lithography (DPL) is one of the few hopeful candidate solutions for the lithography for CMOS process beyond 45nm. DPL assigns the patterns less than a certain di...
This paper presents SafeChoice (SC), a novel clustering algorithm for wirelength-driven placement. Unlike all previous approaches, SC is proposed based on a fundamental theorem, s...
Obstacle-avoiding rectilinear Steiner minimal tree (OARSMT) construction is becoming one of the most sought after problems in modern design flow. In this paper we present FOARS, ...
It is unknown how to include stochastic process variation into fast-multipole-method (FMM) for a full chip capacitance extraction. This paper presents a parallel FMM extraction us...
For a computing system to be trusted, it is equally important to verify that the system performs no more and no less functionalities than desired. Traditional testing and verifica...