1682 search results - page 77 / 337 » Applying Conventional Testing Techniques for Class Testing |
210
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GLVLSI
2002
IEEE
16 years 7 days ago
2002
IEEE
Design simplification is becoming necessary to respect the target time-to-market of SoCs, and this goal can be obtained by using predesigned IP-cores. However, their correct inte...
166
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ICCAD
2006
IEEE
16 years 4 months ago
2006
IEEE
It has been shown that the delay of a target path can be composed linearly of other path delays. If the later paths are robustly testable (with known delay values), the target pat...
198
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IOLTS
2007
IEEE
16 years 1 months ago
2007
IEEE
Soft error due to ionizing radiation is emerging as a major concern for future technologies. The measurement unit for failures due to soft errors is called Failure-In-Time (FIT) t...
192
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ICCD
1997
IEEE
15 years 11 months ago
1997
IEEE
: This paper studies pseudo-random pattern testing of bridging faults. Although bridging faults are generally more random pattern testable than stuck-at faults, examples are shown ...
193
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KDD
2006
ACM
16 years 7 months ago
2006
ACM
Outlier detection can uncover malicious behavior in fields like intrusion detection and fraud analysis. Although there has been a significant amount of work in outlier detection, ...