ct Defect-based testing for digital logic concentrates primarily on methods of test application, including for example at-speed structural tests and IDDQ testing. In contrast, defe...
The amount of memory being embedded on chip is growing rapidly. This strongly implies that memory Built-in-self-test (BIST) logic assumes utmost importance amongst all on chip sel...
Raja Venkatesh, Sailesh Kumar, Joji Philip, Sunil ...
Flash memory has become virtually indispensable in most mobile devices. In order for mobile devices to successfully provide services to users, it is essential that flash memory b...
—Conventional testing methods often fail to detect hidden flaws in complex embedded software such as device drivers or file systems. This deficiency incurs significant developmen...
In today’s information society, flash memory has become a virtually indispensable component, particularly for mobile devices. In order for mobile devices to operate successfully...