36887 search results - page 67 / 7378 » Are We All In the Same |
ECIS
2001
13 years 10 months ago
2001
We are not only in a new millennium but also a new era. A variety of terms such as the Post-Industrial Era (Huber, 1990), the Information Age (Shapiro et al, 1999), the Third Wave...
ICDE
2010
IEEE
13 years 9 months ago
2010
IEEE
Abstract— Modern database management systems (DBMS) answer a multitude of complex queries on increasingly larger datasets. Given the complexities of the queries and the numerous ...
JCP
2007
13 years 9 months ago
2007
— Combining the existing approaches for optical intelligence and the speed and capacity of light is undoubtedly the only viable strategy for building future-proof, highspeed netw...
ENASE
2011
12 years 9 months ago
2011
In previous research, many mutation selection techniques have been proposed to reduce the cost of mutation analysis. After a mutant subset is selected, researchers could obtain a t...
ICCAD
2006
IEEE
14 years 6 months ago
2006
IEEE
Abstract—Manufacturing process variations lead to circuit timing variability and a corresponding timing yield loss. Traditional corner analysis consists of checking all process c...