8 search results - page 2 / 2 » Arithmetic built-in self test for high-level synthesis |
ITC
1997
IEEE
13 years 11 months ago
1997
IEEE
Abstract- This paper describes a new method to generate analog signals with high precision at very low hardware complexity. This method consists in reproducing periodically a recor...
ATS
1998
IEEE
13 years 11 months ago
1998
IEEE
This paper presents a new effective Built-In Self Test (BIST) scheme that achieves 100% fault coverage with low area overhead, and without any modification of the circuit under tes...
IOLTS
2008
IEEE
14 years 1 months ago
2008
IEEE
Present and future semiconductor technologies are characterized by increasing parameters variations as well as an increasing susceptibility to external disturbances. Transient err...