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ETS
2011
IEEE
220views Hardware» more  ETS 2011»
12 years 7 months ago
Structural In-Field Diagnosis for Random Logic Circuits
—In-field diagnosability of electronic components in larger systems such as automobiles becomes a necessity for both customers and system integrators. Traditionally, functional ...
Alejandro Cook, Melanie Elm, Hans-Joachim Wunderli...
ICDM
2002
IEEE
133views Data Mining» more  ICDM 2002»
14 years 20 days ago
Estimating the number of segments in time series data using permutation tests
Segmentation is a popular technique for discovering structure in time series data. We address the largely open problem of estimating the number of segments that can be reliably di...
Kari Vasko, Hannu Toivonen
VLDB
2002
ACM
193views Database» more  VLDB 2002»
13 years 7 months ago
REFEREE: An Open Framework for Practical Testing of Recommender Systems using ResearchIndex
Automated recommendation (e.g., personalized product recommendation on an ecommerce web site) is an increasingly valuable service associated with many databases--typically online ...
Dan Cosley, Steve Lawrence, David M. Pennock
EMSOFT
2008
Springer
13 years 9 months ago
Randomized directed testing (REDIRECT) for Simulink/Stateflow models
The Simulink/Stateflow (SL/SF) environment from Mathworks is becoming the de facto standard in industry for model based development of embedded control systems. Many commercial to...
Manoranjan Satpathy, Anand Yeolekar, S. Ramesh
ICCAD
1995
IEEE
120views Hardware» more  ICCAD 1995»
13 years 11 months ago
Pattern generation for a deterministic BIST scheme
Recently a deterministic built-in self-test scheme has been presented based on reseeding of multiple-polynomial linear feedback shift registers. This scheme encodes deterministic ...
Sybille Hellebrand, Birgit Reeb, Steffen Tarnick, ...